Measuring the electrical properties of semiconductor nanowires using terahertz conductivity spectroscopy

Citation

Joyce, H, Docherty, C, Yong, C et al. 2013, 'Measuring the electrical properties of semiconductor nanowires using terahertz conductivity spectroscopy', SPIE Micro+Nano Materials, Devices, and Applications 2013 Conference, ed. James Friend & H.H Tan, SPIE, New York, pp. 1-6.

Year

2013

Fields of Research

  • Nonlinear Optics And Spectroscopy
  • Nanofabrication, Growth And Self Assembly

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