Spatially resolved characterization of InGaAs/GaAs quantum dot structures by scanning spreading resistance microscopy

Citation

Hakkarainen, T, Douheret, O, Anand, S et al 2010, 'Spatially resolved characterization of InGaAs/GaAs quantum dot structures by scanning spreading resistance microscopy', Applied Physics Letters, vol. 97, no. 4, p. 3.

Year

2010

Field of Research

  • Surfaces And Structural Properties Of Condensed Matter

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