Imaging Charge Trap Distributions in GaN Using Environmental Scanning Electron Micrsocopy

Citation

Toth, M, Kucheyev, S, Williams, J et al 2000, 'Imaging Charge Trap Distributions in GaN Using Environmental Scanning Electron Micrsocopy', Applied Physics Letters, vol. 77, pp. 1342-1344.

Year

2000

Field of Research

  • Plasma Physics; Fusion Plasmas; Electrical Discharges

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