Characterization of Deep Level Traps Responsible for Isolation of Proton Implanted GaAs

Citation

Boudinov, H, Coelho, A, Tan, H et al 2003, 'Characterization of Deep Level Traps Responsible for Isolation of Proton Implanted GaAs', Journal of Applied Physics, vol. 93, no. 6, pp. 3234-3238.

Year

2003

Field of Research

  • Metals And Alloy Materials

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