Evidence of Blocking Effect on Carrier Trapping Process by Necking Region in a Very Narrow AIGaAs/GaAs V-grooved Quantum Wire Structure

Citation

Liu, Q, Sasaki, A, Ohno, N et al 2001, 'Evidence of Blocking Effect on Carrier Trapping Process by Necking Region in a Very Narrow AIGaAs/GaAs V-grooved Quantum Wire Structure', Journal of Applied Physics, vol. 90, no. 10, pp. 5438-5440.

Year

2001

Field of Research

  • Plasma Physics; Fusion Plasmas; Electrical Discharges

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