Transmission Electron Microscopy Observation of Deformation Microstructure under Spherical Indentation in Silicon

Citation

Bradby, J, Williams, J, Wong Leung, Y et al 2000, 'Transmission Electron Microscopy Observation of Deformation Microstructure under Spherical Indentation in Silicon', Applied Physics Letters, vol. 77, pp. 3749-3751.

Year

2000

Field of Research

  • Electrical And Electronic Engineering Not Elsewhere Classified

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