Electrical Characterization of Impurity-free Disordering-induced Defects in n-GaAs using Native Oxide Layers

Citation

Deenapanray, P, Tan, H & Jagadish, C 2003, 'Electrical Characterization of Impurity-free Disordering-induced Defects in n-GaAs using Native Oxide Layers', Applied Physics A: Materials Science and Processing, vol. 76, pp. 961-964.

Year

2003

Field of Research

  • Metals And Alloy Materials

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