An in situ electrical measurement technique via a conducting diamond tip for nanoindentation in silicon

Citation

Ruffell, S, Bradby, J, Williams, J et al 2007, 'An in situ electrical measurement technique via a conducting diamond tip for nanoindentation in silicon', Journal of Materials Research, vol. 22, no. 3, pp. 578-586.

Year

2007

Field of Research

  • Nanotechnology Not Elsewhere Classified

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