Photoluminescence, Deep Level Transient Spectroscopy and Transmission Electron Micrsocopy Measurements on MeV Self-Ion Implanted and Annealed n-type Silicon

Citation

Schmidt, D, Svensson, B, Seibt, M et al 2000, 'Photoluminescence, Deep Level Transient Spectroscopy and Transmission Electron Micrsocopy Measurements on MeV Self-Ion Implanted and Annealed n-type Silicon', Journal of Applied Physics, vol. 88, pp. 2309-2317.

Year

2000

Field of Research

  • Plasma Physics; Fusion Plasmas; Electrical Discharges

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