Photoluminescence, Deep Level Transient Spectroscopy and Transmission Electron Micrsocopy Measurements on MeV Self-Ion Implanted and Annealed n-type Silicon
Citation
Schmidt, D, Svensson, B, Seibt, M et al 2000, 'Photoluminescence, Deep Level Transient Spectroscopy and Transmission Electron Micrsocopy Measurements on MeV Self-Ion Implanted and Annealed n-type Silicon', Journal of Applied Physics, vol. 88, pp. 2309-2317.
Year
2000
Field of Research
- Plasma Physics; Fusion Plasmas; Electrical Discharges