Photoluminescence, Deep Level Transient Spectroscopy and Transmission Electron Micrsocopy Measurements on MeV Self-Ion Implanted and Annealed n-type Silicon

Citation

Schmidt, D, Svensson, B, Seibt, M et al 2000, 'Photoluminescence, Deep Level Transient Spectroscopy and Transmission Electron Micrsocopy Measurements on MeV Self-Ion Implanted and Annealed n-type Silicon', Journal of Applied Physics, vol. 88, pp. 2309-2317.

Year

2000

ANU Authors

Field of Research

  • Plasma Physics; Fusion Plasmas; Electrical Discharges

Updated:  27 September 2023 / Responsible Officer:  Director (Research Services Division) / Page Contact:  Researchers