High Performance Control of Atomic Force Microscope for High-Speed Image Scanning

Citation

Rana, M, Pota, H & Petersen, I 2012, 'High Performance Control of Atomic Force Microscope for High-Speed Image Scanning', 12th International Conference on Control, Automation, Robotics and Vision (ICARCV 2012), Institute of Electrical and Electronics Engineers (IEEE Inc), Piscataway, New Jersey, US, pp. 1187-1192pp.

Year

2012

Field of Research

  • Control Systems, Robotics And Automation

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