High Performance Control of Atomic Force Microscope for High-Speed Image Scanning
Citation
Rana, M, Pota, H & Petersen, I 2012, 'High Performance Control of Atomic Force Microscope for High-Speed Image Scanning', 12th International Conference on Control, Automation, Robotics and Vision (ICARCV 2012), Institute of Electrical and Electronics Engineers (IEEE Inc), Piscataway, New Jersey, US, pp. 1187-1192pp.Year
2012ANU Authors
Field of Research
- Control Systems, Robotics And Automation