Advanced control of atomic force microscope for faster image scanning

Citation

Rana, M, Pota, H & Petersen, I 2014, 'Advanced control of atomic force microscope for faster image scanning', in Lei Liu (ed.), Applied Methods and Techniques for Mechatronic Systems, Springer Berlin Heidelberg, Berlin, pp. 371-388pp.

Year

2014

Field of Research

  • Lasers And Quantum Electronics

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