Advanced control of atomic force microscope for faster image scanning
Citation
Rana, M, Pota, H & Petersen, I 2014, 'Advanced control of atomic force microscope for faster image scanning', in Lei Liu (ed.), Applied Methods and Techniques for Mechatronic Systems, Springer Berlin Heidelberg, Berlin, pp. 371-388pp.Year
2014ANU Authors
Field of Research
- Lasers And Quantum Electronics