Comparison of the structural properties of Zn-face and O-face single crystal homoepitaxial ZnO epilayers grown by RF-magnetron sputtering

Citation

Schifano, R, Riise, H, Domagała, J et al. 2017, 'Comparison of the structural properties of Zn-face and O-face single crystal homoepitaxial ZnO epilayers grown by RF-magnetron sputtering', Journal of Applied Physics, vol. 121, no. 1, pp. 8pp.

Year

2017

ANU Authors

Fields of Research

  • Surfaces And Structural Properties Of Condensed Matter
  • Elemental Semiconductors

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