The use of electron Rutherford backscattering to characterize novel electronic materials as illustrated by a case study of sputter-deposited NbOx films
Citation
Vos, M, Liu, X, Grande, P et al. 2014, 'The use of electron Rutherford backscattering to characterize novel electronic materials as illustrated by a case study of sputter-deposited NbOx films', Nuclear Instruments and Methods in Physics Research: Section B, vol. 340, pp. 58-62.
Year
2014
Field of Research
- Surfaces And Structural Properties Of Condensed Matter