Temperature dependence of blistering in hydrogen implanted Si and Ge
Citation
Pyke, D, Elliman, R & McCallum, J 2013, 'Temperature dependence of blistering in hydrogen implanted Si and Ge', Nuclear Instruments and Methods in Physics Research: Section B, vol. 307, pp. 29-32.Year
2013ANU Authors
Fields of Research
- Surfaces And Structural Properties Of Condensed Matter
- Elemental Semiconductors
- Functional Materials