Temperature dependence of blistering in hydrogen implanted Si and Ge

Citation

Pyke, D, Elliman, R & McCallum, J 2013, 'Temperature dependence of blistering in hydrogen implanted Si and Ge', Nuclear Instruments and Methods in Physics Research: Section B, vol. 307, pp. 29-32.

Year

2013

Fields of Research

  • Surfaces And Structural Properties Of Condensed Matter
  • Elemental Semiconductors
  • Functional Materials

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