Thermal deactivation of lifetime-limiting grown-in point defects in n-type Czochralski silicon wafers

Citation

Rougieux, F, Grant, N & MacDonald, D 2013, 'Thermal deactivation of lifetime-limiting grown-in point defects in n-type Czochralski silicon wafers', Physica Status Solidi: Rapid Research Letters, vol. 7, no. 9, pp. 616-618.

Year

2013

Field of Research

  • Photodetectors, Optical Sensors And Solar Cells

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