Thermal deactivation of lifetime-limiting grown-in point defects in n-type Czochralski silicon wafers

Citation

Rougieux, F, Grant, N & MacDonald, D 2013, 'Thermal deactivation of lifetime-limiting grown-in point defects in n-type Czochralski silicon wafers', Physica Status Solidi: Rapid Research Letters, vol. 7, no. 9, pp. 616-618.

Year

2013

ANU Authors

Field of Research

  • Photodetectors, Optical Sensors And Solar Cells

Updated:  07 June 2023 / Responsible Officer:  Director (Research Services Division) / Page Contact:  Researchers