Boron-oxygen defect imaging in p-type Czochralski silicon

Citation

Lim, S, Rougieux, F & MacDonald, D 2013, 'Boron-oxygen defect imaging in p-type Czochralski silicon', Applied Physics Letters, vol. 103, no. 9, p. 4.

Year

2013

Field of Research

  • Photodetectors, Optical Sensors And Solar Cells

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