Characterization of stress in amorphous silicon nitride and implications to c-Si surface passivation
Citation
Wan, Y, McIntosh, K & Thomson, A 2012, 'Characterization of stress in amorphous silicon nitride and implications to c-Si surface passivation', IEEE Photovoltaic Specialists Conference (PVSC 2012), Curran Associates, Inc., Austin, TX, USA, pp. 1139-1143.Year
2012ANU Authors
Field of Research
- Photodetectors, Optical Sensors And Solar Cells