Characterization of stress in amorphous silicon nitride and implications to c-Si surface passivation

Citation

Wan, Y, McIntosh, K & Thomson, A 2012, 'Characterization of stress in amorphous silicon nitride and implications to c-Si surface passivation', IEEE Photovoltaic Specialists Conference (PVSC 2012), Curran Associates, Inc., Austin, TX, USA, pp. 1139-1143.

Year

2012

ANU Authors

Field of Research

  • Photodetectors, Optical Sensors And Solar Cells

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