On the use of a bias-light correction for trapping effects in photoconductance-based lifetime measurements of silicon

Citation

MacDonald, D, Sinton, R & Cuevas, A 2001, 'On the use of a bias-light correction for trapping effects in photoconductance-based lifetime measurements of silicon', Journal of Applied Physics, vol. 89, no. 5, pp. 2772-2778.

Year

2001

Field of Research

  • Plasma Physics; Fusion Plasmas; Electrical Discharges

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