Imaging and modelling the internal gettering of interstitial iron by grain boundaries in multicrystalline silicon
Citation
Liu, A, Walter, D, Phang, S et al. 2012, 'Imaging and modelling the internal gettering of interstitial iron by grain boundaries in multicrystalline silicon', IEEE Photovoltaic Specialists Conference (PVSC 2012), Curran Associates, Inc., Austin, TX, USA.Year
2012Field of Research
- Photodetectors, Optical Sensors And Solar Cells
