Imaging and modelling the internal gettering of interstitial iron by grain boundaries in multicrystalline silicon

Citation

Liu, A, Walter, D, Phang, S et al 2012, 'Imaging and modelling the internal gettering of interstitial iron by grain boundaries in multicrystalline silicon', IEEE Photovoltaic Specialists Conference (PVSC 2012), Curran Associates, Inc., Austin, TX, USA.

Year

2012

Field of Research

  • Photodetectors, Optical Sensors And Solar Cells

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