Iron-rich particles in heavily contaminated multicrystalline silicon wafers and their response to phosphorus gettering

Citation

MacDonald, D, Phang, S, Rougieux, F et al 2012, 'Iron-rich particles in heavily contaminated multicrystalline silicon wafers and their response to phosphorus gettering', Semiconductor Science and Technology, vol. 27, no. 12, p. 5.

Year

2012

Field of Research

  • Photodetectors, Optical Sensors And Solar Cells

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