Iron-rich particles in heavily contaminated multicrystalline silicon wafers and their response to phosphorus gettering
Citation
MacDonald, D, Phang, S, Rougieux, F et al. 2012, 'Iron-rich particles in heavily contaminated multicrystalline silicon wafers and their response to phosphorus gettering', Semiconductor Science and Technology, vol. 27, no. 12, p. 5.Year
2012ANU Authors
Field of Research
- Photodetectors, Optical Sensors And Solar Cells
