Photoluminescence imaging for net doping measurements of surface limited silicon wafers

Citation

Lim, S, Forster, M, Zhang, X et al 2012, 'Photoluminescence imaging for net doping measurements of surface limited silicon wafers', International Photovoltaic Science and Engineering Conference (PVSEC 2012), ed. YANG Deren, Chinese Renewable Energy Society, Hangzhou China, p. 4.

Year

2012

Field of Research

  • Photodetectors, Optical Sensors And Solar Cells

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