Applications of Photoluminescence Imaging to Dopant and Carrier Concentration Measurements of Silicon Wafers

Citation

Lim, S, Forster, M, Zhang, X et al 2013, 'Applications of Photoluminescence Imaging to Dopant and Carrier Concentration Measurements of Silicon Wafers', IEEE Journal of Photovoltaics, vol. 3, no. 2, pp. 649-655.

Year

2013

Field of Research

  • Photodetectors, Optical Sensors And Solar Cells

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