Imaging crystal orientations in multicrystalline silicon wafers via photoluminescence

Citation

Sio, H, Xiong, Z, Trupke, T et al 2012, 'Imaging crystal orientations in multicrystalline silicon wafers via photoluminescence', Applied Physics Letters, vol. 101, no. 8, p. 4.

Year

2012

Field of Research

  • Photodetectors, Optical Sensors And Solar Cells

Updated:  27 September 2021 / Responsible Officer:  Director (Research Services Division) / Page Contact:  Researchers