Investigating internal gettering of iron at grain boundaries in multicrystalline silicon via photoluminescence imaging
Citation
Liu, A, Walter, D, Phang, S et al. 2012, 'Investigating internal gettering of iron at grain boundaries in multicrystalline silicon via photoluminescence imaging', IEEE Journal of Photovoltaics, vol. 2, no. 4, pp. 479-484.Year
2012Field of Research
- Photodetectors, Optical Sensors And Solar Cells