Imaging of the interstitial iron concentration in crystalline silicon by measuring the dissociation rate of iron-boron pairs
Citation
Herlufsen, S, MacDonald, D, Bothe, K et al 2012, 'Imaging of the interstitial iron concentration in crystalline silicon by measuring the dissociation rate of iron-boron pairs', Physica Status Solidi: Rapid Research Letters, vol. 6, no. 1, pp. 1-3.Year
2012ANU Authors
Field of Research
- Condensed Matter Imaging