Imaging of the interstitial iron concentration in crystalline silicon by measuring the dissociation rate of iron-boron pairs

Citation

Herlufsen, S, MacDonald, D, Bothe, K et al 2012, 'Imaging of the interstitial iron concentration in crystalline silicon by measuring the dissociation rate of iron-boron pairs', Physica Status Solidi: Rapid Research Letters, vol. 6, no. 1, pp. 1-3.

Year

2012

Field of Research

  • Condensed Matter Imaging

Updated:  04 June 2023 / Responsible Officer:  Director (Research Services Division) / Page Contact:  Researchers