Dopant concentration imaging in crystalline silicon wafers by band-to-band photoluminescence

Citation

Lim, S, Phang, S, Trupke, T et al 2011, 'Dopant concentration imaging in crystalline silicon wafers by band-to-band photoluminescence', Journal of Applied Physics, vol. 110, no. 11, pp. 113712-7.

Year

2011

ANU Authors

Field of Research

  • Photodetectors, Optical Sensors And Solar Cells

Updated:  20 September 2021 / Responsible Officer:  Director (Research Services Division) / Page Contact:  Researchers