Dopant concentration imaging in crystalline silicon wafers by band-to-band photoluminescence

Citation

Lim, S, Phang, S, Trupke, T et al 2011, 'Dopant concentration imaging in crystalline silicon wafers by band-to-band photoluminescence', Journal of Applied Physics, vol. 110, no. 11, pp. 113712-7.

Year

2011

Field of Research

  • Photodetectors, Optical Sensors And Solar Cells

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