Dopant concentration imaging in crystalline silicon wafers by band-to-band photoluminescence
Citation
Lim, S, Phang, S, Trupke, T et al 2011, 'Dopant concentration imaging in crystalline silicon wafers by band-to-band photoluminescence', Journal of Applied Physics, vol. 110, no. 11, pp. 113712-7.Year
2011Field of Research
- Photodetectors, Optical Sensors And Solar Cells