Characterization of dielectric layer, laser damage and edge recombination in miniature silicon solar cells

Citation

Zin, N & Blakers, A 2010, 'Characterization of dielectric layer, laser damage and edge recombination in miniature silicon solar cells', IEEE Photovoltaic Specialists Conference, PVSC 2010, IEEE, Honolulu, HI, pp. 003647 - 003653.

Year

2010

Field of Research

  • Photodetectors, Optical Sensors And Solar Cells

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