Dopant Concentration Imaging in Crystalline Silicon Wafers by Band-To-Band Photoluminescence
Citation
Lim, S, Phang, S, Trupke, T et al. 2011, 'Dopant Concentration Imaging in Crystalline Silicon Wafers by Band-To-Band Photoluminescence', European Photovoltaic Solar energy conference and Exhibition 2011, ed. Martin A. Green, Ryne P. Raffaelle, Tim M. Bruton, John Wiley & Sons Inc, Hamburg Germany, pp. 1-4pp.Year
2011Field of Research
- Photodetectors, Optical Sensors And Solar Cells
