Dopant Concentration Imaging in Crystalline Silicon Wafers by Band-To-Band Photoluminescence

Citation

Lim, S, Phang, S, Trupke, T et al 2011, 'Dopant Concentration Imaging in Crystalline Silicon Wafers by Band-To-Band Photoluminescence', European Photovoltaic Solar energy conference and Exhibition 2011, ed. Martin A. Green, Ryne P. Raffaelle, Tim M. Bruton, John Wiley & Sons Inc, Hamburg Germany, pp. 1-4pp.

Year

2011

Field of Research

  • Photodetectors, Optical Sensors And Solar Cells

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