Optical Absorption Measurements of Silica Containing Si Nanocrystals Produced by Ion Implantation and Thermal Annealing
Citation
Elliman, R, Lederer, M & Luther-Davies, B 2002, 'Optical Absorption Measurements of Silica Containing Si Nanocrystals Produced by Ion Implantation and Thermal Annealing', Applied Physics Letters, vol. 80, no. 8, pp. 1325-1327.Year
2002Field of Research
- Metals And Alloy Materials