Scanning X-ray fluorescence microspectroscopy of metallic impurities in solar-grade silicon

Citation

MacDonald, D, Rougieux, F, Mansoulie, Y et al 2010, 'Scanning X-ray fluorescence microspectroscopy of metallic impurities in solar-grade silicon', Physica Status Solidi A, vol. 207, no. 8, pp. 1807-1810.

Year

2010

Field of Research

  • Photodetectors, Optical Sensors And Solar Cells

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