Defect Generation at Charge-Passivated Si-SiO2 Interfaces by Ultraviolet Light

Citation

Black, L & McIntosh, K 2010, 'Defect Generation at Charge-Passivated Si-SiO2 Interfaces by Ultraviolet Light', IEEE Transactions on Electron Devices, vol. 57, no. 8, pp. 1996-2004.

Year

2010

ANU Authors

Field of Research

  • Photodetectors, Optical Sensors And Solar Cells

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