Defect Generation at Charge-Passivated Si-SiO2 Interfaces by Ultraviolet Light
Citation
Black, L & McIntosh, K 2010, 'Defect Generation at Charge-Passivated Si-SiO2 Interfaces by Ultraviolet Light', IEEE Transactions on Electron Devices, vol. 57, no. 8, pp. 1996-2004.Year
2010ANU Authors
Field of Research
- Photodetectors, Optical Sensors And Solar Cells