Measuring dopant concentrations in compensated p-type crystalline silicon via iron-acceptor pairing

Citation

MacDonald, D, Cuevas, A & Geerligs, L 2008, 'Measuring dopant concentrations in compensated p-type crystalline silicon via iron-acceptor pairing', Applied Physics Letters, vol. 92, no. 20, pp. 202119-1 to 202119-3.

Year

2008

Field of Research

  • Electrical And Electronic Engineering Not Elsewhere Classified

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