Measuring dopant concentrations in compensated p-type crystalline silicon via iron-acceptor pairing
Citation
MacDonald, D, Cuevas, A & Geerligs, L 2008, 'Measuring dopant concentrations in compensated p-type crystalline silicon via iron-acceptor pairing', Applied Physics Letters, vol. 92, no. 20, pp. 202119-1 to 202119-3.Year
2008ANU Authors
Field of Research
- Electrical And Electronic Engineering Not Elsewhere Classified