Imaging interstitial iron concentrations in boron-doped crystalline silicon using photoluminescence

Citation

MacDonald, D, Tan, J & Trupke, T 2008, 'Imaging interstitial iron concentrations in boron-doped crystalline silicon using photoluminescence', Journal of Applied Physics, vol. 103, pp. 073710-1 to 073710-7.

Year

2008

Field of Research

  • Electrical And Electronic Engineering Not Elsewhere Classified

Updated:  29 September 2021 / Responsible Officer:  Director (Research Services Division) / Page Contact:  Researchers