Effect of atomic H exposure on thermally oxidized Si/Si02 interfaces
Citation
Zhang, C, Weber, K & Jin, H 2009, 'Effect of atomic H exposure on thermally oxidized Si/Si02 interfaces', European Photovoltaic Solar Energy Conference EUPVSEC 2009, ed. W. Sinke, H.Ossenbrink, P.Helm, WIP-Renewable Energies, Germany, pp. 570-574.Year
2009ANU Authors
Field of Research
- Power And Energy Systems Engineering (Excl. Renewable Power)