Quantitative analysis of grain boundary recombination in multi-crystalline silicon wafers

Citation

Burgers, A, Geerligs, L, MacDonald, D et al 2007, 'Quantitative analysis of grain boundary recombination in multi-crystalline silicon wafers', International Photovoltaic Science and Engineering Conference (PVSEC 2007), ed. Conference Program Committee, Elsevier, Netherlands, pp. 241-242.

Year

2007

Field of Research

  • Materials Engineering Not Elsewhere Classified

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