Comparative Studies using EXAFS and PAC of Lattice Damage in Semiconductors

Citation

Byrne, A, Ridgway, M, Glover, C et al. 2004, 'Comparative Studies using EXAFS and PAC of Lattice Damage in Semiconductors', Hyperfine Interactions, vol. 158, pp. 245-254.

Year

2004

ANU Authors

Field of Research

  • Condensed Matter Characterisation Technique Development

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