Comparative Studies using EXAFS and PAC of Lattice Damage in Semiconductors
Citation
Byrne, A, Ridgway, M, Glover, C et al. 2004, 'Comparative Studies using EXAFS and PAC of Lattice Damage in Semiconductors', Hyperfine Interactions, vol. 158, pp. 245-254.Year
2004ANU Authors
Field of Research
- Condensed Matter Characterisation Technique Development