Measurement of the Electronic Structure of Crystalline Silicon by Electron Momentum Spectroscopy

Citation

Vos, M, Bowles, C, Kheifets, A et al 2004, 'Measurement of the Electronic Structure of Crystalline Silicon by Electron Momentum Spectroscopy', Journal of Electron Spectroscopy and Related Phenomena, vol. 137-140, pp. 629-632.

Year

2004

Field of Research

  • Atomic And Molecular Physics

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