Validity of simplified Shockley-Read-Hall statistics for modelling carrier lifetimes in crystalline silicon

Citation

MacDonald, D & Cuevas, A 2003, 'Validity of simplified Shockley-Read-Hall statistics for modelling carrier lifetimes in crystalline silicon', Physical Review B, vol. 67, pp. 075203-1 to 075203-7.

Year

2003

Fields of Research

  • Electrical And Electronic Engineering Not Elsewhere Classified
  • Electronic And Magnetic Properties Of Condensed Matter; Superconductivity

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