Temperature- and injection-dependent lifetime spectroscopy of copper-related defects in silicon
Citation
MacDonald, D, Cuevas, A, Rein, S et al 2003, 'Temperature- and injection-dependent lifetime spectroscopy of copper-related defects in silicon', World Conference on Photovoltaic Energy Conversion 2003, ed. K Kurokawa, L L Kazmerski, B McNelis, M Yamaguchi, C Wronski, W C Sinke, IEEE Explore, Japan, pp. 1PC3-05_1-4.
Year
2003
Fields of Research
- Structural Chemistry And Spectroscopy
- Electrical And Electronic Engineering Not Elsewhere Classified