Temperature- and injection-dependent lifetime spectroscopy of copper-related defects in silicon

Citation

MacDonald, D, Cuevas, A, Rein, S et al 2003, 'Temperature- and injection-dependent lifetime spectroscopy of copper-related defects in silicon', World Conference on Photovoltaic Energy Conversion 2003, ed. K Kurokawa, L L Kazmerski, B McNelis, M Yamaguchi, C Wronski, W C Sinke, IEEE Explore, Japan, pp. 1PC3-05_1-4.

Year

2003

Fields of Research

  • Structural Chemistry And Spectroscopy
  • Electrical And Electronic Engineering Not Elsewhere Classified

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