In-situ Microscopy Study of Nanocavity Shrinkage in Si under Ion Beam Irradiation

Citation

Ruault, M, Ridgway, M, Fortuna, F et al 2003, 'In-situ Microscopy Study of Nanocavity Shrinkage in Si under Ion Beam Irradiation', European Physical Journal - Applied Physics, vol. 23, pp. 39-40.

Year

2003

Field of Research

  • Electrical And Electronic Engineering Not Elsewhere Classified

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