EFFECTIVE LIFETIME CHARACTERISATION OF A ROOM TEMPERATURE META-STABLE DEFECT IN N-TYPE 5 ΩCM FZ PHOSPHORUS-DIFFUSED OXIDE-PASSIVATED SILICON

Citation

Thomson, A, McIntosh, K & MacDonald, D 2008, 'EFFECTIVE LIFETIME CHARACTERISATION OF A ROOM TEMPERATURE META-STABLE DEFECT IN N-TYPE 5 ΩCM FZ PHOSPHORUS-DIFFUSED OXIDE-PASSIVATED SILICON', European Photovoltaic Solar Energy Conference 2008, ed. Conference Program Committee, Conference Organising Committee, Munich, pp. 517-521.

Year

2008

Field of Research

  • Electrical And Electronic Engineering Not Elsewhere Classified

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