Focused ion beam milling as a universal template technique for patterned growth of carbon nanotubes

Citation

Chen, Y, Chen, H, Yu, J et al 2007, 'Focused ion beam milling as a universal template technique for patterned growth of carbon nanotubes', Applied Physics Letters, vol. 90, no. 093126, pp. 1-3.

Year

2007

Field of Research

  • Nanotechnology Not Elsewhere Classified

Updated:  26 June 2019 / Responsible Officer:  Director (Research Services Division) / Page Contact:  Researchers