Focused ion beam milling as a universal template technique for patterned growth of carbon nanotubes

Citation

Chen, Y, Chen, H, Yu, J et al. 2007, 'Focused ion beam milling as a universal template technique for patterned growth of carbon nanotubes', Applied Physics Letters, vol. 90, no. 093126, pp. 1-3.

Year

2007

Field of Research

  • Nanotechnology Not Elsewhere Classified

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