The Hyperion TM Ion Probe for Next Generation FIB, SIMS and Nano-Ion Implantation

Citation

Smith, N, Tesch, P, Martin, N et al 2009, 'The Hyperion TM Ion Probe for Next Generation FIB, SIMS and Nano-Ion Implantation', Microscopy and Microanalysis, vol. 15, no. Supplement 2, pp. 312-313.

Year

2009

Field of Research

  • Plasma Physics; Fusion Plasmas; Electrical Discharges

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