Measuring the electronic structure of disordered overlayers by electron momentum spectroscopy: the Cu/Si interface

Citation

Nixon, K, Vos, M, Bowles, C et al 2006, 'Measuring the electronic structure of disordered overlayers by electron momentum spectroscopy: the Cu/Si interface', Surface and Interface Analysis, vol. 38, pp. 1236-1241.

Year

2006

Field of Research

  • Particle Physics

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