TEMPERATURE DEPENDENT ELECTRON AND HOLE CAPTURE CROSS SECTIONS OF IRON-CONTAMINATED BORON-DOPED SILICON

Citation

Paudyal, B, McIntosh, K & MacDonald, D 2009, 'TEMPERATURE DEPENDENT ELECTRON AND HOLE CAPTURE CROSS SECTIONS OF IRON-CONTAMINATED BORON-DOPED SILICON', IEEE Photovoltaic Specialists Conference (PVSC 2009), Institute of Electrical and Electronics Engineers (IEEE Inc), Piscataway USA.

Year

2009

Field of Research

  • Photodetectors, Optical Sensors And Solar Cells

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