Dependence of coil sensitivity on sample thickness in inductively coupled photoconductance measurements
Citation
Black, L & Kessels, E 2019, 'Dependence of coil sensitivity on sample thickness in inductively coupled photoconductance measurements', 9th International Conference on Crystalline Silicon Photovoltaics, SiliconPV 2019, ed. S Dubois, S Glunz, P Verlinden, B Rolf, A Weeber, G Hahn, M Poortmans, C Ballif, American Institute of Physics, United States, pp. -.
Year
2019
Fields of Research
- Photodetectors, Optical Sensors And Solar Cells
- Elemental Semiconductors
