Characterization of oxygen self-diffusion in TiO2 resistive-switching layers by nuclear reaction profiling

Citation

Sulzbach, M, Selau, F, Trombini, H et al. 2019, 'Characterization of oxygen self-diffusion in TiO2 resistive-switching layers by nuclear reaction profiling', Nuclear Instruments and Methods in Physics Research: Section B, vol. 441, pp. 8-11.

Year

2019

Fields of Research

  • Electronic And Magnetic Properties Of Condensed Matter; Superconductivity
  • Surfaces And Structural Properties Of Condensed Matter
  • Nanoscale Characterisation

Updated:  09 December 2021 / Responsible Officer:  Director (Research Services Division) / Page Contact:  Researchers