Characterization of oxygen self-diffusion in TiO2 resistive-switching layers by nuclear reaction profiling
Citation
Sulzbach, M, Selau, F, Trombini, H et al. 2019, 'Characterization of oxygen self-diffusion in TiO2 resistive-switching layers by nuclear reaction profiling', Nuclear Instruments and Methods in Physics Research: Section B, vol. 441, pp. 8-11.Year
2019Fields of Research
- Electronic And Magnetic Properties Of Condensed Matter; Superconductivity
- Surfaces And Structural Properties Of Condensed Matter
- Nanoscale Characterisation
