Ring defects in n-type Czochralski-grown silicon: A high spatial resolution study using Fourier-transform infrared spectroscopy, micro-photoluminescence, and micro-Raman

Citation

Basnet, R, Sun, c, Wu, H et al. 2018, 'Ring defects in n-type Czochralski-grown silicon: A high spatial resolution study using Fourier-transform infrared spectroscopy, micro-photoluminescence, and micro-Raman', Journal of Applied Physics, vol. 124, no. 24, pp. 1-7pp.

Year

2018

Field of Research

  • Photodetectors, Optical Sensors And Solar Cells

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