Ring defects in n-type Czochralski-grown silicon: A high spatial resolution study using Fourier-transform infrared spectroscopy, micro-photoluminescence, and micro-Raman
Citation
Basnet, R, Sun, c, Wu, H et al. 2018, 'Ring defects in n-type Czochralski-grown silicon: A high spatial resolution study using Fourier-transform infrared spectroscopy, micro-photoluminescence, and micro-Raman', Journal of Applied Physics, vol. 124, no. 24, pp. 1-7pp.
Year
2018
Field of Research
- Photodetectors, Optical Sensors And Solar Cells