Imaging the Thickness of Passivation Layers for Crystalline Silicon with Micron-Scale Spatial Resolution Using Spectral Photoluminescence

Citation

Nguyen, H, Johnston, S, Basnet, R et al 2017, 'Imaging the Thickness of Passivation Layers for Crystalline Silicon with Micron-Scale Spatial Resolution Using Spectral Photoluminescence', RRL Solar, vol. 1, no. 11, pp. 1-10.

Year

2017

Field of Research

  • Photodetectors, Optical Sensors And Solar Cells

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