Quantification of Sheet Res... - Researchers

Quantification of Sheet Resistance in Boron-Diffused Silicon Using Micro-Photoluminescence Spectroscopy at Room Temperature

Citation

Nguyen, H, Johnston, S, Paduthol, A et al. 2017, 'Quantification of Sheet Resistance in Boron-Diffused Silicon Using Micro-Photoluminescence Spectroscopy at Room Temperature', RRL Solar, vol. 1, no. 10, pp. 7pp.

Year

2017

ANU Authors

Dr Hieu Nguyen
Professor Daniel MacDonald

Field of Research

Elemental Semiconductors

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